We offer Optotherm USA, Infrared Microscopes for devices and PCB's FA applications: The Sentris
The Sentris- Infrared Microscope- Semiconductor Device Failure Analysis and Temperature Mapping.
Sentris applications: Semiconductor Device Failure Analysis, Junction Temperature Measurement, Thermal
Resistance Measurement, Thermal Design, Die Bond Defect Identification, IC Logic Circuit Failure Detection, Circuit Board Failure Analysis, MEMS Thermal Analysis, Fiber Optic Thermal Analysis.
The Sentris key Features: