ATSL - Advanced Technological Solutions Ltd.

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    • Automated Optical Inspection Systems
    • Thin Film Measurement Systems
    • Direct Write Photolithography
    • 3D Optical Measurement Systems
    • Digital Video Measurement Systems
    • Step Size & Roughness Optical Measurements
    • Non Contact Sheet Resistance
    • Annealing Systems
    • Atomic Layer Deposition (ALD)
    • Plasma Enhanced Chemical Vapor Deposition (PECVD)
    • Reactive Ion Etch (RIE)
    • Plasma Strippers
    • Plasma Ashers/Cleaners
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    • Evaporators
    • I.R Microscopes for FA
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Welcome to ATSL

ATSL- Advanced Technological Solutions Ltd. is an Israeli company which represents leading manufacturers from the USA and Europe.

We offer to our customers 25 years of experiance in import, marketing, installations, training and servicing of scientific instruments, R&D, failure analysis and production systems.

We provide comprehensive technological solutions to manufacturing and research organizations in the fields of Semiconductors, Pharmaceuticals, Biotechnology, Materials, Chemistry, Polymers and Optics.

We offer wide selection of technologies including Trace Levels Gas Analyzers, Thin Film Coating, Thin Film measurements, Deposition, Evaporation, Sputtering,  Dry Etch, Plasma Ashing / Cleaning, Nano Characterization, Surface Characterization, Optical Roughness Measurements, Accurate 2D & 3D Measurements, Accurate automated and manual XYZ measurement systems (CMM- Computerized Measuring Machine) and more.       

We are committed to providing you with quality products and services, and strive to be your partner.

Please explore our web site and let us know your need. Following is our product line:

Atomic Layer Deposition (ALD)

Atomic Layer Deposition (ALD)

Annealing Systems

Annealing Systems

Plasma Ashers/Cleaners 

Plasma Ashers/Cleaners

Evaporators

Evaporators

pecvd

Plasma Enhanced Vapor Deposition (PECVD)

rie

Reactive Ion Etch (RIE)

stripper

Plasma stripper

 

Sputtering Systems

Sputtering Systems

3D Optical Measuring Systems

3D Optical Measuring Systems

wave

Size & Roughness Optical Measurements

laserobjective

Digital Video Measurement (CMM) Systems


junction measurement

I.R Microscopes for FA

 


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Thin Film Measurement Systems

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Direct Writer

Non contact Sheet resistance

Non Contact Sheet resistance

wafer

Automated Optical Inspection

 

ATSL Booth at NanoIsrael

 

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ATSL Booth at IVS

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Applications

  • Nano - Fabrication
  • Measurement systems
  • I.R Microscopes for FA
  • Non contact Sheet resistance measurement
  • In-Situ Plasma Ashers
  • Automated Optical Inspection Systems
  • Ellipsometer & Reflectometer

ATSL News

Semicore Introduced Their new Bench-Top Sputtering Systems.
New Affordable Ellipsometers from Film Sense
New Mapping Ellipsometers from Film Sense
Arradiance Representation in Israel.
PhaseView Representation in Israel.
SemiconSoft Representation in Israel
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Copyright © 2012 ATSL - Advanced Technological Solutions Ltd.
email: info@atsl.co.il /Tel: +972-4-8482211 /Fax:+972-4-8482213