Atomic Layer Deposition (ALD)
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Annealing Systems
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Plasma Ashers/Cleaners
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Evaporators
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Plasma Enhanced Vapor Deposition (PECVD)
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Reactive Ion Etch (RIE)
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Plasma stripper
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Sputtering Systems
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3D Optical Measuring Systems
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Size & Roughness Optical Measurements
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Digital Video Measurement (CMM) Systems |
I.R Microscopes for FA
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Thin Film Measurments
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Direct Writer
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Non contact Sheet resistance
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Automated optical inspection system |