ATSL - Advanced Technological Solutions Ltd.

  • Home
  • About Us
  • Products
    • Automated Optical Inspection Systems
    • Thin Film Measurement Systems
    • Direct Write Photolithography
    • 3D Optical Measurement Systems
    • Digital Video Measurement Systems
    • Step Size & Roughness Optical Measurements
    • Non Contact Sheet Resistance
    • Annealing Systems
    • Atomic Layer Deposition (ALD)
    • Plasma Enhanced Chemical Vapor Deposition (PECVD)
    • Reactive Ion Etch (RIE)
    • Plasma Strippers
    • Plasma Ashers/Cleaners
    • Sputter Coaters
    • Evaporators
    • I.R Microscopes for FA
  • Contact Us
  • Skip to content

Products

 ATSL Product Line

 

Atomic Layer Deposition (ALD)

Atomic Layer Deposition (ALD)

Annealing Systems

Annealing Systems

Plasma Ashers/Cleaners 

Plasma Ashers/Cleaners

Evaporators

Evaporators

pecvd

Plasma Enhanced Vapor Deposition (PECVD)

rie

Reactive Ion Etch (RIE)

stripper

Plasma stripper

Sputtering Systems

Sputtering Systems

3D Optical Measuring Systems

3D Optical Measuring Systems

wave

Size & Roughness Optical Measurements

laserobjective

Digital Video Measurement (CMM) Systems

junction measurement

I.R Microscopes for FA

mprobechartstretched

Thin Film Measurments

 pic5

Direct Writer

wafer2

Non contact Sheet resistance

wafer

Automated optical inspection system

Applications

  • Nano - Fabrication
  • Measurement systems
  • I.R Microscopes for FA
  • Non contact Sheet resistance measurement
  • In-Situ Plasma Ashers
  • Automated Optical Inspection Systems
  • Ellipsometer & Reflectometer

ATSL News

Semicore Introduced Their new Bench-Top Sputtering Systems.
New Affordable Ellipsometers from Film Sense
New Mapping Ellipsometers from Film Sense
Arradiance Representation in Israel.
PhaseView Representation in Israel.
SemiconSoft Representation in Israel
Home Products
  • Top
  • Skip to content
Copyright © 2012 ATSL - Advanced Technological Solutions Ltd.
email: info@atsl.co.il /Tel: +972-4-8482211 /Fax:+972-4-8482213